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Transferable tight binding model for strained group IV and III-V heterostructures
Published 25 Apr 2015 in cond-mat.mtrl-sci | (1504.06687v1)
Abstract: In this work, transferable empirical tight binding parameters of strained group IV and III-V semiconductors are generated from ab-initio calculations. The empirical tight binding parameters show good transferability when applied to strained bulk materials as well as ultra-thin superlattices.
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