Directionally Decomposing Structured Light for Projector Calibration

Abstract: Intrinsic projector calibration is essential in projection mapping (PM) applications, especially in dynamic PM. However, due to the shallow depth-of-field (DOF) of a projector, more work is needed to ensure accurate calibration. We aim to estimate the intrinsic parameters of a projector while avoiding the limitation of shallow DOF. As the core of our technique, we present a practical calibration device that requires a minimal working volume directly in front of the projector lens regardless of the projector's focusing distance and aperture size. The device consists of a flat-bed scanner and pinhole-array masks. For calibration, a projector projects a series of structured light patterns in the device. The pinholes directionally decompose the structured light, and only the projected rays that pass through the pinholes hit the scanner plane. For each pinhole, we extract a ray passing through the optical center of the projector. Consequently, we regard the projector as a pinhole projector that projects the extracted rays only, and we calibrate the projector by applying the standard camera calibration technique, which assumes a pinhole camera model. Using a proof-of-concept prototype, we demonstrate that our technique can calibrate projectors with different focusing distances and aperture sizes at the same accuracy as a conventional method. Finally, we confirm that our technique can provide intrinsic parameters accurate enough for a dynamic PM application, even when a projector is placed too far from a projection target for a conventional method to calibrate the projector using a fiducial object of reasonable size.