Monolithically Integrated Wavelength-meter in InP with measurement bandwidth of 100nm centered on the C band

Abstract: In this paper we will explore the creation of a monolithically integrated wavelength meter in InP. This type of devices are a key requirement for many applications and it is especially important to have them integrated with active components like lasers and gain sections. We present a wavelength meter based on multiple ring resonators that has been realized in a commercial MPW run and tested using a tunable laser. The designed circuit is theoretically capable of resolution down to 1.6pm and a measurement speed down to 500ps within a wavelength range of 100nm.