Is AFM-IR a photothermal technique?

Abstract: Atomic Force Microscopy - Infrared (AFM-IR) has emerged as a useful technique for measuring absorption spectra with spatial resolution better than the optical diffraction limit. The technique relies on the movement of a probe for atomic force microscopy for detecting the local expansion of a material caused by the photothermal effect. While AFM-IR is seeing increased application to a wider range of samples, reports have also appeared in the literature that are inconsistent with an interpretation of the AFM-IR response simply in terms of photothermal expansion. The present article addresses the issue by critically evaluating existing experimental observations. It is concluded that observed discrepancies arise from the contribution of non-photothermal effects to the signal, which affect both intensity and spatial resolution of the measurement.