Shack-Hartmann wavefront sensing: A new approach to time-resolved measurement of stress intensity during dynamic fracture of small brittle specimens

Published 2 Oct 2023 in cond-mat.mtrl-sci and physics.ins-det | (2310.00862v1)

Abstract: The stress intensity factor is important for understanding crack initiation and propagation. Because it cannot be measured directly, the characterization of the stress intensity factor relies on the measurement of deformation around a crack tip. Such measurements are challenging for dynamic fracture of brittle materials where the deformation is small and the crack tip velocity can be high (>1 km/s). Digital gradient sensing (DGS) is capable of full-field measurement of surface deformation with sub-microsecond temporal resolution, but it is limited to centimeter-scale specimens and has a spatial resolution of only $\sim 1$mm. This limits its ability to measure deformations close to the crack tip. Here, we demonstrate the potential of Shack-Hartmann wavefront sensing (SHWFS), as an alternative to DGS, for measuring surface deformation during dynamic brittle fracture of millimeter-scale specimens. Using an commercial glass ceramic as an example material, we demonstrate the capability of SHWFS to measure the surface slope evolution induced by a propagating crack on millimeter-scale specimens with a micrometer-scale spatial resolution and a sub-microsecond temporal resolution. The SHWFS apparatus has the additional advantage of being physically more compact than a typical DGS apparatus. We verify our SHWFS measurements by comparing them with analytical predictions and phase-field simulations of the surface slope around a crack tip. Then, fitting the surface slope measurements to the asymptotic crack-tip field solution, we extract the evolution of the apparent stress intensity factor associated with the propagating crack tip. We conclude by discussing potential future enhancements of this technique and how its compactness could enable the integration with other characterization techniques including x-ray phase-contrast imaging (XPCI) toward a multi-modal characterization.