Scalable nanoimprint manufacturing of multi-layer hybrid metasurface device

Abstract: Optical metasurfaces, consisting of subwavelength-scale meta-atom arrays, hold great promise to overcome fundamental limitations of conventional optics. Scalable nanomanufacturing of metasurfaces with high uniformity and reproducibility is key to transferring technology from laboratory demonstrations to commercialization. Recently, nanoimprint lithography (NIL) has attracted increasing interests for metasurface fabrication because of its superior nanometer resolution, rapid prototyping and large-area manufacturing capability. Despite NIL demonstrations of single-layer metasurface, scalable fabrication of double- and multi-layer metasurfaces remains challenging. Here we leverage the nanometer-scale resolution and 3D pattern transfer capability of NIL to fabricate multi-layered metasurfaces for on-chip polarimetric imaging devices. Our process achieved sub-100 nm nanostructures, high alignment accuracy (translational error <200 nm; rotational error <0.02{\deg}), and good uniformity (<4 nm linewidth deviation) over >20 mm2. This NIL-based, low-cost and high-throughput nanomanufacturing approach paves the way toward scalable production of a plethora of metasurface structures for ultra-compact optic and optoelectronic devices and systems.