2000 character limit reached
Quantitatively predicting angle-resolved polarized Raman intensity of black phosphorus flakes
Published 24 Mar 2024 in cond-mat.mes-hall and cond-mat.mtrl-sci | (2403.16053v2)
Abstract: In this study, we propose two strategies to determine complex refractive indexes along armchair and zigzag axes for BP flakes, aiming in predicting angle-resolved polarized Raman (ARPR) intensity by explicitly considering birefringence, linear dichroism, and anisotropic cavity interference effects within multilayered structures. By leveraging this methodology, we have identified the intrinsic complex Raman tensors for phonon modes of BP flakes, independent of BP flake thickness (>20 nm). We also elucidated the flake thickness-dependent effective complex Raman tensor elements, allowing for precise prediction of the observed ARPR intensity profile for specific BP flake. This framework can be extended to other ALM flakes deposited on dielectric substrate to determine the Raman tensors for fully predicting their ARPR response.
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