Advancing Pre-trained Teacher: Towards Robust Feature Discrepancy for Anomaly Detection
Abstract: With the wide application of knowledge distillation between an ImageNet pre-trained teacher model and a learnable student model, industrial anomaly detection has witnessed a significant achievement in the past few years. The success of knowledge distillation mainly relies on how to keep the feature discrepancy between the teacher and student model, in which it assumes that: (1) the teacher model can jointly represent two different distributions for the normal and abnormal patterns, while (2) the student model can only reconstruct the normal distribution. However, it still remains a challenging issue to maintain these ideal assumptions in practice. In this paper, we propose a simple yet effective two-stage industrial anomaly detection framework, termed as AAND, which sequentially performs Anomaly Amplification and Normality Distillation to obtain robust feature discrepancy. In the first anomaly amplification stage, we propose a novel Residual Anomaly Amplification (RAA) module to advance the pre-trained teacher encoder. With the exposure of synthetic anomalies, it amplifies anomalies via residual generation while maintaining the integrity of pre-trained model. It mainly comprises a Matching-guided Residual Gate and an Attribute-scaling Residual Generator, which can determine the residuals' proportion and characteristic, respectively. In the second normality distillation stage, we further employ a reverse distillation paradigm to train a student decoder, in which a novel Hard Knowledge Distillation (HKD) loss is built to better facilitate the reconstruction of normal patterns. Comprehensive experiments on the MvTecAD, VisA, and MvTec3D-RGB datasets show that our method achieves state-of-the-art performance.
- J. Deng, W. Dong, R. Socher, L.-J. Li, K. Li, and L. Fei-Fei, “Imagenet: A large-scale hierarchical image database,” in 2009 IEEE conference on computer vision and pattern recognition. Ieee, 2009, pp. 248–255.
- K. Roth, L. Pemula, J. Zepeda, B. Schölkopf, T. Brox, and P. Gehler, “Towards total recall in industrial anomaly detection,” in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2022, pp. 14 318–14 328.
- H. Deng and X. Li, “Anomaly detection via reverse distillation from one-class embedding,” in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2022, pp. 9737–9746.
- D. Gudovskiy, S. Ishizaka, and K. Kozuka, “Cflow-ad: Real-time unsupervised anomaly detection with localization via conditional normalizing flows,” in Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision, 2022, pp. 98–107.
- G. Wang, S. Han, E. Ding, and D. Huang, “Student-teacher feature pyramid matching for anomaly detection,” arXiv preprint arXiv:2103.04257, 2021.
- M. Salehi, N. Sadjadi, S. Baselizadeh, M. H. Rohban, and H. R. Rabiee, “Multiresolution knowledge distillation for anomaly detection,” in Proceedings of the IEEE/CVF conference on computer vision and pattern recognition, 2021, pp. 14 902–14 912.
- T. D. Tien, A. T. Nguyen, N. H. Tran, T. D. Huy, S. Duong, C. D. T. Nguyen, and S. Q. Truong, “Revisiting reverse distillation for anomaly detection,” in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2023, pp. 24 511–24 520.
- X. Zhang, S. Li, X. Li, P. Huang, J. Shan, and T. Chen, “Destseg: Segmentation guided denoising student-teacher for anomaly detection,” in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2023, pp. 3914–3923.
- Y. Zou, J. Jeong, L. Pemula, D. Zhang, and O. Dabeer, “Spot-the-difference self-supervised pre-training for anomaly detection and segmentation,” in European Conference on Computer Vision. Springer, 2022, pp. 392–408.
- J. Kirkpatrick, R. Pascanu, N. Rabinowitz, J. Veness, G. Desjardins, A. A. Rusu, K. Milan, J. Quan, T. Ramalho, A. Grabska-Barwinska et al., “Overcoming catastrophic forgetting in neural networks,” Proceedings of the national academy of sciences, vol. 114, no. 13, pp. 3521–3526, 2017.
- A. Creswell, T. White, V. Dumoulin, K. Arulkumaran, B. Sengupta, and A. A. Bharath, “Generative adversarial networks: An overview,” IEEE signal processing magazine, vol. 35, no. 1, pp. 53–65, 2018.
- M. Rudolph, B. Wandt, and B. Rosenhahn, “Structuring autoencoders,” in Proceedings of the IEEE/CVF International Conference on Computer Vision Workshops, 2019, pp. 0–0.
- D. Gong, L. Liu, V. Le, B. Saha, M. R. Mansour, S. Venkatesh, and A. v. d. Hengel, “Memorizing normality to detect anomaly: Memory-augmented deep autoencoder for unsupervised anomaly detection,” in Proceedings of the IEEE/CVF International Conference on Computer Vision, 2019, pp. 1705–1714.
- L. Wang, J. Tian, S. Zhou, H. Shi, and G. Hua, “Memory-augmented appearance-motion network for video anomaly detection,” Pattern Recognition, vol. 138, p. 109335, 2023.
- J. Hou, Y. Zhang, Q. Zhong, D. Xie, S. Pu, and H. Zhou, “Divide-and-assemble: Learning block-wise memory for unsupervised anomaly detection,” in Proceedings of the IEEE/CVF International Conference on Computer Vision, 2021, pp. 8791–8800.
- S. Lu, W. Zhang, H. Zhao, H. Liu, N. Wang, and H. Li, “Anomaly detection for medical images using heterogeneous auto-encoder,” IEEE Transactions on Image Processing, 2024.
- D. P. Kingma and M. Welling, “Auto-encoding variational bayes,” arXiv preprint arXiv:1312.6114, 2013.
- J. Li, Q. Huang, Y. Du, X. Zhen, S. Chen, and L. Shao, “Variational abnormal behavior detection with motion consistency,” IEEE Transactions on Image Processing, vol. 31, pp. 275–286, 2021.
- V. Zavrtanik, M. Kristan, and D. Skočaj, “Reconstruction by inpainting for visual anomaly detection,” Pattern Recognition, vol. 112, p. 107706, 2021.
- R. Rombach, A. Blattmann, D. Lorenz, P. Esser, and B. Ommer, “High-resolution image synthesis with latent diffusion models,” in Proceedings of the IEEE/CVF conference on computer vision and pattern recognition, 2022, pp. 10 684–10 695.
- J. Ho, A. Jain, and P. Abbeel, “Denoising diffusion probabilistic models,” Advances in neural information processing systems, vol. 33, pp. 6840–6851, 2020.
- J. Wyatt, A. Leach, S. M. Schmon, and C. G. Willcocks, “Anoddpm: Anomaly detection with denoising diffusion probabilistic models using simplex noise,” in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2022, pp. 650–656.
- Y. Teng, H. Li, F. Cai, M. Shao, and S. Xia, “Unsupervised visual defect detection with score-based generative model,” arXiv preprint arXiv:2211.16092, 2022.
- F. Lu, X. Yao, C.-W. Fu, and J. Jia, “Removing anomalies as noises for industrial defect localization,” in Proceedings of the IEEE/CVF International Conference on Computer Vision, 2023, pp. 16 166–16 175.
- X. Zhang, N. Li, J. Li, T. Dai, Y. Jiang, and S.-T. Xia, “Unsupervised surface anomaly detection with diffusion probabilistic model,” in Proceedings of the IEEE/CVF International Conference on Computer Vision, 2023, pp. 6782–6791.
- V. Zavrtanik, M. Kristan, and D. Skočaj, “Draem-a discriminatively trained reconstruction embedding for surface anomaly detection,” in Proceedings of the IEEE/CVF International Conference on Computer Vision, 2021, pp. 8330–8339.
- C.-L. Li, K. Sohn, J. Yoon, and T. Pfister, “Cutpaste: Self-supervised learning for anomaly detection and localization,” in Proceedings of the IEEE/CVF conference on computer vision and pattern recognition, 2021, pp. 9664–9674.
- H. M. Schlüter, J. Tan, B. Hou, and B. Kainz, “Natural synthetic anomalies for self-supervised anomaly detection and localization,” in European Conference on Computer Vision. Springer, 2022, pp. 474–489.
- M. Z. Zaheer, J.-H. Lee, A. Mahmood, M. Astrid, and S.-I. Lee, “Stabilizing adversarially learned one-class novelty detection using pseudo anomalies,” IEEE Transactions on Image Processing, vol. 31, pp. 5963–5975, 2022.
- M. Cimpoi, S. Maji, I. Kokkinos, S. Mohamed, and A. Vedaldi, “Describing textures in the wild,” in Proceedings of the IEEE conference on computer vision and pattern recognition, 2014, pp. 3606–3613.
- K. Perlin, “An image synthesizer,” ACM Siggraph Computer Graphics, vol. 19, no. 3, pp. 287–296, 1985.
- Z. Liu, Y. Zhou, Y. Xu, and Z. Wang, “Simplenet: A simple network for image anomaly detection and localization,” in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2023, pp. 20 402–20 411.
- V. Zavrtanik, M. Kristan, and D. Skočaj, “Dsr–a dual subspace re-projection network for surface anomaly detection,” in European conference on computer vision. Springer, 2022, pp. 539–554.
- T. Defard, A. Setkov, A. Loesch, and R. Audigier, “Padim: a patch distribution modeling framework for anomaly detection and localization,” in International Conference on Pattern Recognition. Springer, 2021, pp. 475–489.
- Y. Wang, J. Peng, J. Zhang, R. Yi, Y. Wang, and C. Wang, “Multimodal industrial anomaly detection via hybrid fusion,” in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2023, pp. 8032–8041.
- M. Rudolph, B. Wandt, and B. Rosenhahn, “Same same but differnet: Semi-supervised defect detection with normalizing flows,” in Proceedings of the IEEE/CVF winter conference on applications of computer vision, 2021, pp. 1907–1916.
- M. Rudolph, T. Wehrbein, B. Rosenhahn, and B. Wandt, “Fully convolutional cross-scale-flows for image-based defect detection,” in Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision, 2022, pp. 1088–1097.
- X. Yao, R. Li, J. Zhang, J. Sun, and C. Zhang, “Explicit boundary guided semi-push-pull contrastive learning for supervised anomaly detection,” in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2023, pp. 24 490–24 499.
- D. Rezende and S. Mohamed, “Variational inference with normalizing flows,” in International conference on machine learning. PMLR, 2015, pp. 1530–1538.
- M. Rudolph, T. Wehrbein, B. Rosenhahn, and B. Wandt, “Asymmetric student-teacher networks for industrial anomaly detection,” in Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision, 2023, pp. 2592–2602.
- X. Yao, R. Li, Z. Qian, Y. Luo, and C. Zhang, “Focus the discrepancy: Intra-and inter-correlation learning for image anomaly detection,” in Proceedings of the IEEE/CVF International Conference on Computer Vision, 2023, pp. 6803–6813.
- T.-Y. Lin, P. Goyal, R. Girshick, K. He, and P. Dollár, “Focal loss for dense object detection,” in Proceedings of the IEEE international conference on computer vision, 2017, pp. 2980–2988.
- P. Bergmann, M. Fauser, D. Sattlegger, and C. Steger, “Mvtec ad–a comprehensive real-world dataset for unsupervised anomaly detection,” in Proceedings of the IEEE/CVF conference on computer vision and pattern recognition, 2019, pp. 9592–9600.
- P. Bergmann, X. Jin, D. Sattlegger, and C. Steger, “The mvtec 3d-ad dataset for unsupervised 3d anomaly detection and localization,” arXiv preprint arXiv:2112.09045, 2021.
- S. Zagoruyko and N. Komodakis, “Wide residual networks,” arXiv preprint arXiv:1605.07146, 2016.
- P. Bergmann, M. Fauser, D. Sattlegger, and C. Steger, “Uninformed students: Student-teacher anomaly detection with discriminative latent embeddings,” in Proceedings of the IEEE/CVF conference on computer vision and pattern recognition, 2020, pp. 4183–4192.
- L. Van der Maaten and G. Hinton, “Visualizing data using t-sne.” Journal of machine learning research, vol. 9, no. 11, 2008.
Paper Prompts
Sign up for free to create and run prompts on this paper using GPT-5.
Top Community Prompts
Collections
Sign up for free to add this paper to one or more collections.