Single-Shot, Single-Mask X-ray Dark-field and Phase Contrast Imaging

Abstract: X-ray imaging, traditionally relying on attenuation contrast, struggles to differentiate materials with similar attenuation coefficients like soft tissues. X-ray phase contrast imaging (XPCI) and dark-field (DF) imaging provide enhanced contrast by detecting phase shifts and ultra-small-angle X-ray scattering (USAXS). However, they typically require complex and costly setups, along with multiple exposures to retrieve various contrast features. In this study, we introduce a novel single-mask X-ray imaging system design that simultaneously captures attenuation, differential phase contrast (DPC), and dark-field images in a single exposure. Most importantly, our proposed system design requires just a single mask alignment with relatively low-resolution detectors. Using our novel light transport models derived for these specific system designs, we show intuitive understanding of contrast formation and retrieval method of different contrast features. Our approach eliminates the need for highly coherent X-ray sources, ultra-high-resolution detectors, spectral detectors or intricate gratings. We propose three variations of the single-mask setup, each optimized for different contrast types, offering flexibility and efficiency in a variety of applications. The versatility of this single-mask approach along with the use of befitting light transport models holds promise for broader use in clinical diagnostics and industrial inspection, making advanced X-ray imaging more accessible and cost-effective.