Free-Space Characterization Setup for Low-Loss UV-261nm Waveguides in Aluminum Oxide

Abstract: Here, we report a characterization setup for low-loss integrated photonic waveguides in aluminum oxide, tailored for deep UV applications. The setup includes a 261nm UV light source, objective lenses for free-space coupling, an automated stage, and a UV camera. The measured losses for the aluminum oxide waveguides in the UV-261nm range were calculated to be 4.9485 dB/cm. These results demonstrate the effectiveness of the setup in achieving low-loss characterization of integrated photonics waveguides for deep UV applications.