Avoiding exponential scaling without relaxing typical device constraints
Establish whether the exponential sampling-overhead scaling in the number of circuit cuts can be avoided without significantly relaxing the local-device constraints typically assumed in circuit knitting, even for restricted graph families.
References
However, even for restricted graph families, it has remained open whether this can be achieved without significantly relaxing the device requirements typically assumed in circuit knitting.
— Exponential-to-polynomial scaling of measurement overhead in circuit knitting via quantum tomography
(2512.19623 - Harada et al., 22 Dec 2025) in Introduction — Background